Nicole van der Wel, M3-133, 64757,
Head Electron Microscopy
Henk van Veen, M3-106-1, 64703,
Manager Electron Microscopes, Epon, negative staining, SEM
Daisy Picavet, M3-131, 60080,
ImmunoEM, Epon, negative staining, SEM
Anita Grootemaat, M3-106-1, 64703,
ImmunoEM, Epon, negative staining
Per Larson, M3-131, 65634,
TEM diagnostics
Jeannette Pankras, M3-131,
TEM diagnostics
Edwin Scholl, M3-106-1, 64771,
Electron Microscope Operator, Research Analist
Sanne van der Niet, M3-131, 60080, PhD student